63(9) ImgXop
Three-Dimensional GaN-Ga₂O₃ Core Shell Structure Revealed by X-Ray Diffraction Microscopy
Jianwei Miao, Chien-Chun Chen, Changyong Song, Yoshinori Nishino, Yoshiki Kohmura, Tetsuya Ishikawa, Damien Ramunno-Johnson, Ting-Kuo Lee, and Subhash H. Risbud
Physical Review Letters, Volume 97, Number 21, 24 November 2006, p. 215503
Phys. Rev. Lett. 97, 215503 (2006)

62(8) Xop
Development of scanning x-ray fluorescence microscope with spatial resolution of 30 nm using Kirkpatrick-Baez mirror optics
S. Matsuyama, H. Mimura, H. Yumoto, Y. Sano, K. Yamamura, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi
Review of Scientific Instruments, Volume 77, Issue 10, October 2006, p. 103102
Rev. Sci. Instrum. 77, 103102 (2006)

61(7) Img
First Application of X-ray Refraction-based Computed Tomography to a Biomedical Object
Eiko Hashimoto, Anton Maksimenko, Hiroshi Sugiyama, Kazuyuki Hyodo, Daisuke Shimao, Yoshinori Nishino, Tetsuya Ishikawa, and Masami Ando
Zoological Science, Volume 23, No. 9, September 2006, pp. 809-813
Zool. Sci. 23, 809-813 (2006)

60(6) Xop
Development of mirror manipulator for hard-x-ray nanofocusing at sub-50-nm level
S. Matsuyama, H. Mimura, H. Yumoto, H. Hara, K. Yamamura, Y. Sano, K. Endo, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi
Review of Scientific Instruments, Volume 77, Issue 9, September 2006, p. 093107
Rev. Sci. Instrum. 77, 093107 (2006)

59(5) XopSpc
Single-Shot Spectrometry for X-Ray Free-Electron Lasers
Makina Yabashi, Jerome B. Hastings, Max S. Zolotorev, Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Kazuto Yamauchi, and Tetsuya Ishikawa
Physical Review Letters, Volume 97, Number 8, 25 August 2006, p. 084802
Phys. Rev. Lett. 97, 084802 (2006)

58(4) ImgXop
Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data
A. V. Darahanau, A. Y. Nikulin, R. A. Dilanian, B. C. Muddle, A. Souvorov, Y. Nishino, and T. Ishikawa
Applied Physics Letters, Volume 88, Issue 26, 26 June 2006, pp. 263113
Appl. Phys. Lett. 88, 263113 (2006)

57(3) Xop
At-wavelength figure metrology of hard x-ray focusing mirrors
Hirokatsu Yumoto, Hidekazu Mimura, Satoshi Matsuyama, Soichiro Handa, Yasuhisa Sano, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, and Kazuto Yamauchi
Review of Scientific Instruments, Volume 77, Issue 6, June 2006, p. 063712
Rev. Sci. Instrum. 77, 063712 (2006)

56(2) Xop
Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm²
J. P. Sutter, A. Q. R. Baron, D. Miwa, Y. Nishino, K. Tamasaku, and T. Ishikawa
Journal of Synchrotron Radiation, Volume 13, Part 3, May 2006, pp. 278-280
J. Synchrotron Rad. 13, 278-280 (2006)

55(1) Spc
Electronic structure of strained (La_0.85Ba_0.15)MnO₃ thin films with room-temperature ferromagnetism investigated by hard x-ray photoemission spectroscopy
Hidekazu Tanaka, Yasutaka Takata, Koji Horiba, Munetaka Taguchi, Ashish Chainani, Shik Shin, Daigo Miwa, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, Eiji Ikenaga, Mitsuhiro Awaji, Akihisa Takeuchi, Tomoji Kawai, and Keisuke Kobayashi
Physical Review B, Volume 73, Number 9, 1 March 2006, p. 094403
Phys. Rev. B 73, 094403 (2006)

54(11) Xop
Wave-optical evaluation of interference fringes and wavefront phase in a hard-x-ray beam totally reflected by mirror optics
Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Katsuyoshi Endo, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori
Applied Optics, Volume 44, Issue 32, 10 November 2005, pp. 6927-6932
Appl. Opt. 44, 6927-6932 (2005)

53(10) Spc
Evidence for Suppressed Screening on the Surface of High Temperature La2-xSrxCuO4 and Nd2-xCexCuO4 Superconductors
M. Taguchi, A. Chainani, K. Horiba, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, T. Takeuchi, K. Yamamoto, M. Matsunami, S. Shin, T. Yokoya, E. Ikenaga, K. Kobayashi, T. Mochiku, K. Hirata, J. Hori, K. Ishii, F. Nakamura, and T. Suzuki
Physical Review Letters, Volume 95, Number 17, 21 October 2005, p. 177002
Phys. Rev. Lett. 95, 177002 (2005)

52(9) ImgXop
Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone
Jianwei Miao, Yoshinori Nishino, Yoshiki Kohmura, Bart Johnson, Changyong Song, Subhash H. Risbud, and Tetsuya Ishikawa
Physical Review Letters, Volume 95, Number 8, 19 August 2005, p. 085503
Phys. Rev. Lett. 95, 085503 (2005)

51(8) Xop
Diffraction-limited two-dimensional hard-x-ray focusing at the 100 nm level using a Kirkpatrick-Baez mirror arrangement
S. Matsuyama, H. Mimura, H. Yumoto, K. Yamamura, Y. Sano, K. Endo, Y. Mori, Y. Nishino, K. Tamasaku, T. Ishikawa, M. Yabashi, and K. Yamauchi
Review of Scientific Instruments, Volume 76, Issue 8, August 2005, p. 083114
Rev. Sci. Instrum. 76, 083114 (2005)

50(7) Xop
Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials
A.V. Darahanau, A.Y. Nikulin, A. Souvorov, Y. Nishino, B.C. Muddle, and T. Ishikawa
Optics Communications, Volume 251, Issues 1-3, 1 July 2005, pp. 100-108
Opt. Commun. 251, 100-108 (2005)

49(6) ImgXop
Element Array by Scanning X-ray Fluorescence Microscopy after Cis-Diamminedichloro-Platinum(II) Treatment
Mari Shimura, Akira Saito, Satoshi Matsuyama, Takahiro Sakuma, Yasuhito Terui, Kazumasa Ueno, Hirokatsu Yumoto, Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Makina Yabashi, Kenji Tamasaku, Kazuto Nishio, Yoshinori Nishino, Katsuyoshi Endo, Kiyohiko Hatake, Yuzo Mori, Yukihito Ishizaka, and Tetsuya Ishikawa
Cancer Research Volume 65, Issue 12, 15 June 2005, pp. 4998-5002
Cancer Res. 65, 4998-5002 (2005)

48(5) Xop
Fabrication of elliptically figured mirror for focusing hard x rays to size less than 50 nm
Hirokatsu Yumoto, Hidekazu Mimura, Satoshi Matsuyama, Hideyuki Hara, Kazuya Yamamura, Yasuhisa Sano, Kazumasa Ueno, Katsuyoshi Endo, Yuzo Mori, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, and Kazuto Yamauchi
Review of Scientific Instruments, Volume 76, Issue 6, June 2005, p. 063708
Rev. Sci. Instrum. 76, 063708 (2005)

47(4) Xop
Hard X-ray Diffraction-Limited Nanofocusing with Kirkpatrick-Baez Mirrors
Hidekazu Mimura, Satoshi Matsuyama, Hirokatsu Yumoto, Hideyuki Hara, Kazuya Yamamura, Yasuhisa Sano, Masafumi Shibahara, Katsuyoshi Endo, Yuzo Mori, Yoshinori Nishino, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi
Japanese Journal of Applied Physics, Volume 44, Part 2, No. 18, 15 April 2005, pp. L539-L542
Jpn. J. Appl. Phys. 44, L539-L542 (2005)

46(3) Spc
Bulk screening in core-level photoemission from Mott-Hubbard and charge-transfer systems
M. Taguchi, A. Chainani, N. Kamakura, K. Horiba, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, S. Shin, E. Ikenaga, T. Yokoya, K. Kobayashi, T. Mochiku, K. Hirata, and K. Motoya
Physical Review B, Volume 71, Number 15, 15 April 2005, p. 155102
Phys. Rev. B 71, 155102 (2005)

45(2) Xop
Relative angle determinable stitching interferometry for hard x-ray reflective optics
Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Kazuya Yamamura, Yasuhisa Sano, Kazumasa Ueno, Katsuyoshi Endo, Yuzo Mori, Makina Yabashi, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, and Kazuto Yamauchi
Review of Scientific Instruments, Volume 76, Issue 4, April 2005, p. 045102
Rev. Sci. Instrum. 76, 045102 (2005)

44(1) Xop
Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data
A.V. Darahanau, A.Y. Nikulin, A. Souvorov, Y. Nishino, B.C. Muddle, and T. Ishikawa
Physics Letters A, Volume 335, Issues 5-6, 21 February 2005, pp. 494-498
Phys. Lett. A 335, 494-498 (2005)

43(14) Spc
Valence Transition of YbInCu₄ Observed in Hard X-Ray Photoemission Spectra
Hitoshi Sato, Kenya Shimada, Masashi Arita, Koichi Hiraoka, Kenichi Kojima, Yukiharu Takeda, Kunta Yoshikawa, Masahiro Sawada, Masashi Nakatake, Hirofumi Namatame, Masaki Taniguchi, Yasutaka Takata, Eiji Ikenaga, Shik Shin, Keisuke Kobayashi, Kenji Tamasaku, Yoshinori Nishino, Daigo Miwa, Makina Yabashi, and Tetsuya Ishikawa
Physical Review Letters, Volume 93, Number 24, 10 December 2004, p. 246404
Phys. Rev. Lett. 93, 246404 (2004)

42(13) Spc
Nature of the Well Screened State in Hard X-Ray Mn 2p Core-Level Photoemission Measurements of La_1-xSr_xMnO₃ Films
K. Horiba, M. Taguchi, A. Chainani, Y. Takata, E. Ikenaga, D. Miwa, Y. Nishino, K. Tamasaku, M. Awaji, A. Takeuchi, M. Yabashi, H. Namatame, M. Taniguchi, H. Kumigashira, M. Oshima, M. Lippmaa, M. Kawasaki, H. Koinuma, K. Kobayashi, T. Ishikawa, and S. Shin
Physical Review Letters, Volume 93, Number 23, 3 December 2004, p. 236401
Phys. Rev. Lett. 93, 236401 (2004)

41(12) Xop
X-ray multiple diffraction from crystalline multilayers: Application to a 90° Bragg reflection
A. Souvorov, T. Ishikawa, A. Y. Nikulin, Yuri P. Stetsko, Shih-Lin Chang, and P. Zaumseil
Physical Review B, Volume 70, Number 22, 1 December 2004, p. 224109
Phys. Rev. B 70, 224109 (2004)

40(11) Spc
Hybridization of Cr 3d-N 2p-Ga 4s in the wide bandgap diluted magnetic semiconductor Ga_1-x Cr_xN
J. J. Kim, H. Makino, K. Kobayashi, Y. Takata, T. Yamamoto, T. Hanada, M. W. Cho, E. Ikenaga, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, S. Shin, and T. Yao
Physical Review B, Volume 70, Number 16, 15 October 2004, p. 161315(R)
Phys. Rev. B 70, 161315(R) (2004)

39(10) Xop
An X-ray BBB Michelson interferometer
John P. Sutter, Tetsuya Ishikawa, Ulrich Kuetgens, Gerhard Materlik, Yoshinori Nishino, Armen Rostomyan, Kenji Tamasaku, and Makina Yabashi
Journal of Synchrotron Radiation, Volume 11, Part 5, September 2004, pp. 378-385
J. Synchrotron Rad. 11, 378-385 (2004)

39(9) ImgXop
Phase retrieval with two-beam off-axis x-ray holography
Yoshiki Kohmura, Tatsuyuki Sakurai, Tetsuya Ishikawa, and Yoshio Suzuki
Journal of Applied Physics, Volume 96, Issue 4, 15 August 2004, pp. 1781-1784
J. Appl. Phys. 96, 1781-1784 (2004)

37(8) Spc
Intrinsic Valence Band Study of Molecular-Beam-Epitaxy-Grown GaAs and GaN by High-Resolution Hard X-ray Photoemission Spectroscopy
Keisuke Kobayashi, Yasutaka Takata, Tetsuya Yamamoto, Jung-Jin Kim, Hisao Makino, Kenji Tamasaku, Makina Yabashi, Daigo Miwa, Tetsuya Ishikawa, Shik Shin, and Takafumi Yao
Japanese Journal of Applied Physics, Volume 69, Number 43, 1 August 2004, pp. L1029-L1031
Jpn. J. Appl. Phys. 43, L1029-L1031 (2004)

36(7) Xop
Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics
Hidekazu Mimura, Kazuto Yamauchi, Kazuya Yamamura, Akihisa Kubota, Satoshi Matsuyama, Yasuhisa Sano, Kazumasa Ueno, Katsuyoshi Endo, Yoshinori Nishino, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, and Yuzo Mori
Journal of Synchrotron Radiation, Volume 11, Part 4, July 2004, pp. 343-346
J. Synchrotron Rad. 11, 343-346 (2004)

35(6) Xop
High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique
A. Y. Nikulin, A. V. Darahanau, R. Horney, and T. Ishikawa
Physica B, Volume 349, Issues 1-4, 15 June 2004, pp. 281-295
Physica B 349, 281-295 (2004)

34(5) Spc
A probe of intrinsic valence band electronic structure: Hard x-ray photoemission
Y. Takata, K. Tamasaku, T. Tokushima, D. Miwa, S. Shin, T. Ishikawa, M. Yabashi, K. Kobayashi, J. J. Kim, T. Yao, T. Yamamoto, M. Arita, H. Namatame, and M. Taniguchi
Applied Physics Letters, Volume 84, Issue 21, 24 May 2004, pp. 4310-4312
Appl. Phys. Lett. 84, 4310-4312 (2004)

33(4) Spc
Bulk electronic structure of Na_0.35CoO₂·1.3H₂O
A. Chainani, T. Yokoya, Y. Takata, K. Tamasaku, M. Taguchi, T. Shimojima, N. Kamakura, K. Horiba, S. Tsuda, S. Shin, D. Miwa, Y. Nishino, T. Ishikawa, M. Yabashi, K. Kobayashi, H. Namatame, M. Taniguchi, K. Takada, T. Sasaki, H. Sakurai, and E. Takayama-Muromachi
Physical Review B, Volume 69, Number 18, 1 May 2004, p. 180508(R)
Phys. Rev. B 69, 180508(R) (2004)

32(3) ImgXop
Three-Dimensional Coherent X-Ray Microscopy
Ian K. Robinson and Jianwei Miao
MRS Bulletin, olume 29, No. 3, March 2004, pp. 177-181
MRS Bull. 29, 177-181 (2004)

31(2) Xop
Intensity interferometry for the study of x-ray coherence
M. Yabashi, K. Tamasaku, and T. Ishikawa
Physical Review A, Volume 69, Number 2, February 2004, p. 023813
Phys. Rev. A 69, 023813 (2004)

30(1) ImgXop
Taking X-Ray Diffraction to the Limit: Macromolecular Structures from Femtosecond X-Ray Pulses and Differentiation Microscopy of Cells with Synchrotron Radiation
Jianwei Miao, Henry N. Chapman, Janos Kirz, David Sayre, Keith O. Hodgson
Annual Review of Biophysics and Biomolecular Structure, Volume 33, 2004, pp. 157-176
Annu. Rev. Bioph. Biom. 33, 157-176 (2004)

29(13) Xop
Gaussian-like shaping of coherent synchrotron X-rays
A. Y. Nikulin, A. Y. Souvorov, K. Tamasaku, and T. Ishikawa
Physics Letters A, Volume 319, Issues 5-6, 15 December 2003, pp. 434-438
Phys. Lett. A 319, 434-438 (2003)

28(12) ImgXop
Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities
Yoshinori Nishino, Jianwei Miao, and Tetsuya Ishikawa
Physical Review B, Volume 68, Number 22, 1 December 2003, p. 220101(R)
Phys. Rev. B 68, 220101(R) (2003)

27(11) Spc
Evidence for a magnetic moment on Ir in IrMnAl from x-ray magnetic circular dichroism
V. V. Krishnamurthy, N. Kawamura, M. Suzuki, T. Ishikawa, G. J. Mankey, P. Raj, A. Sathyamoorthy, Amish G. Joshi, and S. K. Malik
Physical Review B, Volume 68, Number 21, 1 December 2003, p. 214413
Phys. Rev. B 68, 214413 (2003)

26(10) Xop
Two-dimensional Submicron Focusing of Hard X-rays by Two Elliptical Mirrors Fabricated by Plasma Chemical Vaporization Machining and Elastic Emission Machining
Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Katsuyoshi Endo, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori
Japanese Journal of Applied Physics, Volume 42, Part 1, No. 11, 15 November, 2003, pp. 7129-7134
Jpn. J. Appl. Phys. 42, 7129-7134 (2003)

25(9) Xop
Fabrication of elliptical mirror at nanometer-level accuracy for hard x-ray focusing by numerically controlled plasma chemical vaporization machining
Kazuya Yamamura, Kazuto Yamauchi, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Katsuyoshi Endo, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori
Review of Scientific Instruments, Volume 74, Issue 10, October 2003, pp. 4549-4553
Rev. Sci. Instrum. 74, 4549-4553 (2003)

24(8) Spc
High resolution-high energy x-ray photoelectron spectroscopy using third-generation synchrotron radiation source and its application to Si-high k insulator systems
K. Kobayashi, M. Yabashi, Y. Takata, T. Tokushima, S. Shin, K. Tamasaku, D. Miwa, T. Ishikawa, H. Nohira, T. Hattori, Y. Sugita, O. Nakatsuka, A. Sakai, and S. Zaima
Applied Physics Letters 83, Issue 5, 4 August 2003, pp. 1005-1007
Appl. Phys. Lett. 83, 1005-1007 (2003)

23(7) ImgXop
Direct determination of the absolute electron density of nanostructured and disordered materials at sub-10-nm resolution
Jianwei Miao, James E. Amonette, Yoshinori Nishino, Tetsuya Ishikawa, and Keith O. Hodgson
Physical Review B, Volume 68, Number 1, 1 Jul 2003, p. 012201
Phys. Rev. B 68, 012201 (2003)

22(6) Spc
Magnetism of Ir in Fe₂IrSi from Ir L_2,3 edge x-ray magnetic circular dichroism spectroscopy
V. V. Krishnamurthy, J. L. Weston, G. J. Mankey, M. Suzuki, N. Kawamura, and T. Ishikawa
Journal of Applied Physics, Volume 93, Issue 10, 15 May, 2003, pp. 7981-7983
J. Appl. Phys. 93, 7981-7983 (2003)

21(5) ImgXop
Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method
Jianwei Miao, Tetsuya Ishikawa, Erik H. Anderson, and Keith O. Hodgson
Physical Review B, Volume 67, Number 17, 1 May 2003, p. 174104
Phys. Rev. B 67, 174104 (2003)

20(4) Xop
Microstitching interferometry for x-ray reflective optics
Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Kazumasa Ueno, Katsuyoshi Endo, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori
Review of Scientific Instruments, Volume 74, Issue 5, May 2003, pp. 2894-2898
Rev. Sci. Instrum. 74, 2894-2898 (2003)

19(3) Dif
The onset of quadrupole ordering at the structural phase transition in DyB₂C₂
Yoshikazu Tanaka, Yoshikazu Tabata, Koichi Katsumata, Kenji Tamasaku, Tetsuya Ishikawa, Naomi Kawamura, Motohiro Suzuki, Hiroko Aruga Katori, Stephen W Lovesey, Hiroki Yamauchi, Hideya Onodera, and Yasuo Yamaguchi
Journal of Physics: Condensed Matter, Volume 15, Number 10, 19 March 2003, pp. L185-L190
J. Phys.: Condens. Matter 15, L185-L190 (2003)

18(2) ImgXop
Imaging whole Escherichia coli bacteria by using single-particle x-ray diffraction
Jianwei Miao, Keith O. Hodgson, Tetsuya Ishikawa, Carolyn A. Larabell, Mark A. LeGros, and Yoshinori Nishino
Proceedings of the National Academy of Sciences of the United States of America, Volume 100, Issue 1, 7 January 2003, pp. 110-112
Proc. Natl. Acad. Sci. USA 100, 110 (2003)

17(1) XopSpc
Application of optical scanner to switching of x-ray photon helicities at kHz range
Motohiro Suzuki, Naomi Kawamura, and Tetsuya Ishikawa
Review of Scientific Instruments, Volume 74, Issue 1, January 2003, pp. 19-22
Rev. Sci. Instrum. 74, 19-22 (2003)

20(10) Spc
Photon interference effect in x-ray absorption spectra over a wide energy range
Y. Nishino, T. Ishikawa, M. Suzuki, N. Kawamura, P. Kappen, P. Korecki, N. Haack, and G. Materlik
Physical Review B, Volume 66, Number 11, 15 September 2002, p. 113103
Phys. Rev. B 66, 113103 (2002)

15(7) DifImg
Two-energy twin image removal in atomic-resolution x-ray holography
Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi, and E. Matsubara
Physical Review B, Volume 66, Number 9, 1 September 2002, p. 092105
Phys. Rev. B 66, 092105 (2002)

14(6) Xop
Nearly diffraction-limited line focusing of a hard-X-ray beam with an elliptically figured mirror
Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori
Journal of Synchrotron Radiation, Volume 9, Part 5, September 2002, pp. 313-316
J. Synchrotron Rad. 9, 313-316 (2002)

13(5) ImgXop
High resolution 3D x-ray diffraction microscopy
Jianwei Miao, Tetsuya Ishikawa, Bart Johnson, Erik H. Anderson, Barry Lai, and Keith O. Hodgson
Physical Review Letters, Volume 89, Number 8, 19 August 2002, p. 088303
Phys. Rev. Lett. 89, 088303 (2002)
Also included in: Physical Review Focus, Nature Science Update, Nature Physics Portal

12(4) Xop
The Goos-Haenchen effect at Bragg diffraction
Kenji Tamasaku and Tetsuya Ishikawa
Acta Crystallographica Section A, Volume A58, Part 4, July 2002, pp. 408-409
Acta Cryst. A 58, 408-409 (2002)
[Reprint(PDF) Copyright (C) International Union of Crystallography]

11(3) Xop
Deterministic retrieval of surface waviness by means of topography with coherent x-rays
A. Souvorov, M. Yabashi, K. Tamasaku, T. Ishikawa, Y. Mori, K. Yamauchi, K. Yamamura, and A. Saito
Journal of Synchrotron Radiation, Volume 9, Part 4, July 2002, pp. 223-228
J. Synchrotron Rad. 9, 223-228 (2002)

10(2) XopLsr
Optical switching of x-rays using laser-induced lattice expansion
Yoshihito Tanaka, Toru Hara, Hiroshi Yamazaki, Hideo Kitamura, and Tetsuya Ishikawa
Journal of Synchrotron Radiation, Volume 9, Part 2, March 2002, pp. 96-98
J. Synchrotron Rad. 9, 96-98 (2002)
[Reprint(PDF) Copyright (C) International Union of Crystallography]

9(1) Xop
X-Ray interferometry with multicrystal components using intensity correlation
K. Tamasaku, M. Yabashi, and T. Ishikawa
Physical Review Letters, Volume 88, Number 4, 28 January 2002, p. 044801
Phys. Rev. Lett. 88, 044801 (2002)

8(6) Xop
X-ray phase retrieval in high-resolution refraction data from amorphous materials
K. Siu, A. Y. Nikulin, K. Tamasaku, and T. Ishikawa
Applied Physics Letters, Volume 79, Issue 13, 24 September 2001, pp. 2112-2114
Appl. Phys. Lett. 79, 2112-2114 (2001)

7(5) Xop
An application of phase retrieval x-ray diffractometry to refraction/small-angle scattering data
K. Siu, A. Y. Nikulin, K. Tamasaku, and T. Ishikawa
Journal of Physics D : Applied Physics, Volume 34, Number 18, 21 September 2001, pp. 2912-2917
J. Phys. D: Appl. Phys. 34, 2912-2917 (2001)

6(4) Xop
Visibility measurement with an x-ray interferometer using a coincidence technique
Makina Yabashi, Kenji Tamasaku, and Tetsuya Ishikawa
Japanese Journal of Applied Physics, Volume 40, Part 2, No. 6B, 15 June 2001, pp. L646-L647
Jpn. J. Appl. Phys. 40, L646-L647 (2001)

5(3) Xop
Quantitative determination of the spatial coherence from the visibility of equal-thickness fringes
Kenji Tamasaku and Tetsuya Ishikawa
Acta Crystallographica Section A, Volume A57, Part 2, March 2001, pp. 197-200
Acta Cryst. A 57, 197-200 (2001)
[Reprint(PDF) Copyright (C) International Union of Crystallography]

4(2) Xop
Experimental studies of 90° Bragg reflection from a sub-micron In_xGa_1-xAs single-crystal film deposited on a GaAs substrate
Andrei Y. Nikulin, Kenji Tamasaku, Brian F. Usher, and Tetsuya Ishikawa
Japanese Journal of Applied Physics, Volume 40, Part 1, No. 2A, 15 February 2001, pp. 898-903
Jpn. J. Appl. Phys. 40, 898-903 (2001)

3(1) Spc
Site-selective x-ray absorption fine structure analysis of an optically active center in Er-doped semiconductor thin film using x-ray-excited optical luminescence
Masashi Ishii, Yoshihito Tanaka, Tetsuya Ishikawa, Shuji Komuro, Takitaro Morikawa, and Yoshinobu Aoyagi
Applied Physics Letters, Volume 78, Issue 2, 8 January 2001, pp. 183-185
Appl. Phys. Lett. 78, 183-185 (2001)

2(2) Ins
Performance of a CsI photocathode in a hard x-ray streak camera
Toru Hara, Yoshihito Tanaka, Hideo Kitamura, and Tetsuya Ishikawa
Review of Scientific Instruments, Volume 71, Issue 10, October 2000, pp. 3624-3626
Rev. Sci. Istrum. 71, 3624-3626 (2000)

1(1) LsrIns
Timing control of an intense picosecond pulse laser to the SPring-8 synchrotron raditaion pulses
Yoshihito Tanaka, Toru Hara, Hideo Kitamura, and Tetsuya Ishikawa
Review of Scientific Instruments, Volume 71, Issue 3, March 2000, pp. 1268-1274
Rev. Sci. Istrum. 71, 1268-1274 (2000)

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