The 11th InternationalConference on X-Ray Absorption Fine Structure (XAFS XI)
26-31 July, 2000; Ako, JAPAN
Organized by JAERI/RIKEN/JASRI/JSSRR

XMCD measurement at Ni K-edge in Ni-Rh alloys
V. V. Krishnamurthy, N. Kawamura, M. Suzuki,Y. Kohori and T. Ishikawa

Temperature dependence of XMCD spectrum atR L2,3-edges in R3Fe5O12 (R=Gdand Er)
N. Kawamura, M. Suzuki, H. Maruyama and T. Ishikawa

Multielectron excitation probed by helicity-modulationXMCD at K-edge in 3d transition metal compounds
N. Kawamura, T. Yamamoto, H. Maruyama, I. Harada,M. Suzuki and T. Ishikawa

Study of x-ray excited optical luminescenceof impurity atoms in semiconductor by using undulator light source at SPring-8
M. Ishii, Y. Tanaka, S. Komuro, T. Morikawa,Y. Aoyagi and T. Ishikawa

Polarization tunability using x-ray phase retarderfor magnetic EXAFS spectroscopy
M. Suzuki, N. Kawamura, M. Mizumaki, S. Gotoand T. Ishikawa

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