SPIE's 45th AnnualMeeting
International Symposiumon Optical Science Technology
30 July - 4 August, 2000; San Diego, CA, USA
Organized by The International Society forOptical Engineering

One kilometer beamline at SPring-8
T. Ishikawa, K. Tamasaku, M. Yabashi, S. Goto, Y. Tanaka, H. Yamazaki, K. Takeshita, H. Kimura, H. Ohashi, T. Matsushita and T. Ohata
SPIE Proceedings, Vol. 4145 (2001) 1-10.

X-ray optics for modulation spectroscopy
M. Suzuki, N. Kawamura and T. Ishikawa
SPIE Proceedings, Vol. 4145 (2001) 140-149.

90-degree Bragg reflection from a thin crystalline film
A. Y. Nikulin, J. R. Davis, B. Usher, A. K. Freund and T. Ishikawa
SPIE Proceedings, Vol. 4145 (2001) 129-139.

Phase retrieval x-ray diffractometry (PRXRD): refraction/small anglescattering data applications
K. Siu, A. Y. Nikulin, A. K. Freund and T. Ishikawa
SPIE Proceedings, Vol. 4145 (2001) 157-167.

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